Modular, Motorised and Manual Upright Microscopes
Superb Nikon CFI60-2 optics provide excellent images to both eyepieces and to Nikon’s digital imaging cameras with analysis software. Thanks to the modular design, the universal microscope allows complementary optical contrast techniques on one microscope stand.
Nikon ECLIPSE LV150NA and LV150N
These microscopes with episcopic illumination are for inspection of semiconductors, industrial materials and components. They are also suited to research and development applications.
Nikon CFI60-2 Optical Series
Nikon’s innovative design enables clear imaging techniques, including high-contrast, brightfield, darkfield, polarisation (POL), interference contrast (DIC) and double beam interferometry optical contrast.
Nikon Digital Sight Cameras
The full range of Nikon’s Digital Sight cameras can capture images of a sample and deliver them to the image processing software of the NIS-Elements suite, together with microscope data on the objective lens, magnification setting and light intensity when using the LV-ECON E controller.
Integration of LV150N and Wafer Loader NWL200
Nikon’s wafer loaders are well accepted and trusted across the semiconductor industry and many installations are in use today.
Product Highlights
Universal Optical Contrast Methods
Reflected light: brightfield, darkfield, polarising (POL), differential interference contrast (DIC), epi-fluorescence and two-beam interferometry.
Modular Component Accessories
From lamphouse to eyepiece, components are selected to match a user’s application. They include stands, stages, objectives, nosepieces, optical heads, eyepieces, digital cameras, filters and contrast technique accessories.
Intelligent Digital Communication
By means of an LV-ECON E controller, LV150NA and LV150N microscopes can detect and control the objective lens, light intensity, aperture and epi-contrast via Nikon’s NIS-Elements software. The LV150N detects and reports on the objective lens using the LV-NU5I and LV-INAD.
Ergonomic Design
Optimal positioning of operator controls and a variable angle eye-tube allow fatigue-free work. The right-way-up, right-way-around image enables raw materials, semiconductors and industrial components to be correctly observed.
