Modular Motorised and Manual Upright Microscopes
Superb Nikon CFI60-2 optics provide excellent images to both eyepieces and to Nikon’s digital imaging cameras with analysis software. The universal microscope design allows complementary optical contrast techniques together on one microscope stand thanks to a modular component programme.
Nikon ECLIPSE LV100NDA and LV100ND
These microscopes with episcopic and diascopic illumination are intended for inspection of industrial materials and components as well as research and development applications.
Nikon CFI60-2 Optical Series
Nikon’s innovative design enables clear imaging techniques, including high contrast, brightfield, darkfield, polarisation (POL), differential interference contrast (DIC) and double beam interferometry optical contrast.
Nikon Digital Sight Cameras
All Nikon Digital Sight cameras efficiently capture images of a sample and deliver them to the image processing software of the NIS-Elements suite, together with microscope data on the objective lens used, magnification setting and light intensity.
Product Highlights
Universal Optical Contrast Methods
Reflected light: brightfield, darkfield, polarising (POL), differential interference contrast (DIC), epi-fluorescence and two-beam interferometry.
Transmitted light: brightfield, darkfield, polarising (POL), differential interference contrast (DIC) and phase contrast.
Modular Component Accessories
From lamphouse to eyepieces, components are selected to match a user’s application. They include stands, stages, objectives, nosepieces, optical heads, eyepieces, digital cameras, filters and contrast technique accessories.
Intelligent Digital Communication
The LV100NDA detects and controls objective lens value, position, light intensity, aperture and contrast via Nikon software.
The LV100ND detects and reports on the objective lens used by LV-NU5I and LV-INAD.
Ergonomic Design
Optimal positioning of operator controls and a variable angle eye-tube allow fatigue-free work, providing a right-way-up, right-way-around image for correctly observing materials, semiconductors and industrial components.
